Dr. Sanbin Chen
at North China institute of photoelectric technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 October 2015 Paper
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Thin films, Monochromatic aberrations, Interferometers, Crystals, Wavefronts, Polarizers, Optical testing, Refraction, Electro optics, Phase shifts

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