Dr. Sandeep Kumar Dey
Software Engineer at Intel Corp
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | February 17, 2016
JM3 Vol. 15 Issue 01
KEYWORDS: Logic, Very large scale integration, Printing, Distance measurement, Image segmentation, Lithography, Optical proximity correction, Teeth, Scanning electron microscopy

PROCEEDINGS ARTICLE | March 18, 2015
Proc. SPIE. 9427, Design-Process-Technology Co-optimization for Manufacturability IX
KEYWORDS: Lithography, Teeth, Image segmentation, Germanium, Printing, Distance measurement, Very large scale integration, Optical proximity correction, Lead, Protactinium

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