Dr. Sander de Putter
at ASML Netherlands BV
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 2 April 2010
Proc. SPIE. 7638, Metrology, Inspection, and Process Control for Microlithography XXIV
KEYWORDS: Reticles, Metrology, Scanners, Image analysis, Scanning electron microscopy, Data acquisition, Photomasks, Critical dimension metrology, Semiconducting wafers, Data corrections

Proceedings Article | 4 March 2010
Proc. SPIE. 7640, Optical Microlithography XXIII
KEYWORDS: Reticles, Logic, Imaging systems, Scanners, Wavefronts, Control systems, Optical alignment, Critical dimension metrology, Semiconducting wafers, Overlay metrology

Proceedings Article | 13 March 2006
Proc. SPIE. 6143, Medical Imaging 2006: Physiology, Function, and Structure from Medical Images
KEYWORDS: Modeling, Mechanics, Tissues, Image segmentation, Interfaces, Computed tomography, Chemical elements, Biomedical engineering, Natural surfaces, Systems modeling

Proceedings Article | 13 March 2006
Proc. SPIE. 6143, Medical Imaging 2006: Physiology, Function, and Structure from Medical Images
KEYWORDS: Computational fluid dynamics, Mechanics, Visualization, Blood, Magnetic resonance imaging, Image segmentation, Computer simulations, Image registration, Blood circulation, 3D image processing

Proceedings Article | 13 March 2006
Proc. SPIE. 6143, Medical Imaging 2006: Physiology, Function, and Structure from Medical Images
KEYWORDS: Modeling, Magnetic resonance imaging, Image segmentation, Error analysis, Mercury, Image resolution, Arteries, Medical imaging, Computed tomography, Biomedical engineering

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