Dr. Sani Muke
Senior Research Scientist at Note Printing Australia
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 3, 2004
Proc. SPIE. 5310, Optical Security and Counterfeit Deterrence Techniques V
KEYWORDS: Staring arrays, Modeling, Moire patterns, Lenses, Polymers, Laser engraving, 3D modeling, Printing, Ray tracing, Imaging arrays

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