Dr. Saša Bajt
Group Leader at Deutsches Elektronen-Synchrotron
SPIE Involvement:
Symposium Chair | Conference Chair | Conference Program Committee | Editor | Author
Publications (41)

SPIE Conference Volume | 10 July 2017

SPIE Conference Volume | 1 June 2015

Proceedings Article | 12 May 2015
Proc. SPIE. 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV
KEYWORDS: Multilayers, Polishing, Silica, Etching, X-rays, Silicon, Coating, Surface roughness, Wet etching, Diffraction gratings

Proceedings Article | 3 May 2013
Proc. SPIE. 8777, Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
KEYWORDS: Mirrors, Multilayers, X-ray optics, Polymethylmethacrylate, Signal attenuation, Photons, Reflectivity, Optical testing, Photomicroscopy, Free electron lasers

Proceedings Article | 19 October 2012
Proc. SPIE. 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
KEYWORDS: Diffraction, Optical spheres, Scattering, Sensors, Aerosols, Photons, X-rays, Wavefronts, Profiling, Free electron lasers

Showing 5 of 41 publications
Conference Committee Involvement (8)
Optics Damage and Materials Processing by EUV/X-ray Radiation (XDam7)
1 April 2019 | Prague, Czech Republic
SPIE Optics + Optoelectronics
1 April 2019 | Prague, Czech Republic
Damage to VUV, EUV, and X-ray Optics (XDam6)
24 April 2017 | Prague, Czech Republic
Damage to VUV, EUV, and X-ray Optics V (XDam5)
15 April 2015 | Prague, Czech Republic
Damage to VUV, EUV, and X-ray Optics IV
15 April 2013 | Prague, Czech Republic
Showing 5 of 8 published special sections
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