Dr. Satish Kumar Dubey
at Siemens Information Systems Ltd
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 3, 2008
Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology
KEYWORDS: Optical filters, Refractive index, Light sources, Sensors, Optical coherence tomography, Glasses, Charge-coupled devices, Superluminescent diodes, Tunable filters, Signal detection

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