Dr. Satoshi Hasegawa
at Utsunomiya Univ
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | February 17, 2017
Proc. SPIE. 10092, Laser-based Micro- and Nanoprocessing XI
KEYWORDS: Holography, Femtosecond phenomena, Two photon polymerization, Polarization, Laser processing, Laser ablation, Computer generated holography, Spatial light modulators, Beam shaping, Pulsed laser operation, Nanolithography

PROCEEDINGS ARTICLE | March 4, 2016
Proc. SPIE. 9764, Complex Light and Optical Forces X
KEYWORDS: Diffraction, Holography, Modulation, Polarization, Spatial frequencies, Laser processing, Computer generated holography, Computer generated holography, Femtosecond laser micromachining, Nanolithography

PROCEEDINGS ARTICLE | December 24, 2011
Proc. SPIE. 8204, Smart Nano-Micro Materials and Devices
KEYWORDS: Diffraction, Holography, Femtosecond phenomena, Glasses, Laser processing, Wavefronts, Computer generated holography, Spatial light modulators, Adaptive control, Laser systems engineering

PROCEEDINGS ARTICLE | February 22, 2011
Proc. SPIE. 7920, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVI
KEYWORDS: Infrared imaging, Diffraction, Holograms, Holography, Femtosecond phenomena, Computer generated holography, Spatial light modulators, Liquid crystals, Harmonic generation, Absorption

PROCEEDINGS ARTICLE | February 11, 2011
Proc. SPIE. 7925, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI
KEYWORDS: Diffraction, Holography, Femtosecond phenomena, Dispersion, Lens design, Spatial light modulators, Spatial resolution, Two photon excitation microscopy, Pulsed laser operation, Diffraction gratings

PROCEEDINGS ARTICLE | February 18, 2010
Proc. SPIE. 7584, Laser Applications in Microelectronic and Optoelectronic Manufacturing XV
KEYWORDS: Diffraction, Holograms, Holography, Femtosecond phenomena, Image processing, Computer generated holography, Spatial light modulators, Image sensors, Nonlinear crystals, Absorption

Showing 5 of 7 publications
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