Dr. Saul Doherty
at Thales Optronics Ltd
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 18, 2005
Proc. SPIE. 5786, Window and Dome Technologies and Materials IX
KEYWORDS: X-rays, X-ray microscopy, Manufacturing, Surface roughness, Atomic force microscopy, Scanning electron microscopy, Optoelectronics, Boron, Plasma enhanced chemical vapor deposition, Photoemission spectroscopy

PROCEEDINGS ARTICLE | May 18, 2005
Proc. SPIE. 5786, Window and Dome Technologies and Materials IX
KEYWORDS: Polishing, Polarization, Electrodes, Coating, Resistance, Corrosion, Boron, Plasma enhanced chemical vapor deposition, Chemical analysis, Dielectric spectroscopy

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