Dr. Saulius Nevas
at Aalto Univ School of Science and Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 25, 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Thin films, Refractive index, Polarization, Reflectivity, Optical testing, Refraction, Collimation, Transmittance, Spectrophotometry, Absorption

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