Dr. Scott H. Goodwin
at RTI International
SPIE Involvement:
Author
Publications (29)

PROCEEDINGS ARTICLE | May 3, 2016
Proc. SPIE. 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
KEYWORDS: Packaging, Infrared detectors, Mid-IR, Sensors, Detector development, Projection systems, Infrared radiation, Integrated circuits, Integrated circuit design, Temperature metrology

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9452, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI
KEYWORDS: Packaging, Infrared detectors, Mid-IR, Electronics, Sensors, Silicon, Detector development, Projection systems, Infrared radiation, Integrated circuits

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9452, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI
KEYWORDS: Mid-IR, Etching, Dry etching, Metals, Dielectrics, Silicon, Resistance, Infrared radiation, Resistors, Semiconducting wafers

PROCEEDINGS ARTICLE | June 9, 2014
Proc. SPIE. 9071, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV
KEYWORDS: Packaging, Nonuniformity corrections, Infrared imaging, Mid-IR, Dielectrics, Projection systems, Infrared radiation, Integrated circuits, Spatial resolution, Device simulation

PROCEEDINGS ARTICLE | May 29, 2014
Proc. SPIE. 9071, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV
KEYWORDS: Packaging, Infrared imaging, Silicon, Scanning electron microscopy, Projection systems, Infrared radiation, Integrated circuits, Semiconducting wafers, Cryogenics, Infrared systems engineering

PROCEEDINGS ARTICLE | May 11, 2012
Proc. SPIE. 8356, Technologies for Synthetic Environments: Hardware-in-the-Loop XVII
KEYWORDS: Infrared imaging, Electronics, Manufacturing, Control systems, Projection systems, Finite element methods, Infrared radiation, Failure analysis, Prototyping, Device simulation

Showing 5 of 29 publications
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