Dr. Scott A. Mathews
Associate Professor at Catholic Univ of America
SPIE Involvement:
Conference Program Committee | Author
Publications (27)

PROCEEDINGS ARTICLE | August 24, 2017
Proc. SPIE. 10343, Metamaterials, Metadevices, and Metasystems 2017
KEYWORDS: Vanadium, Metamaterials, Thin films, Metals, Transition metals, Electromagnetic radiation, Light-matter interactions, Thin film devices, Fast packet switching, Tunable metamaterials

PROCEEDINGS ARTICLE | February 20, 2017
Proc. SPIE. 10091, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXII
KEYWORDS: Vanadium, Metamaterials, Thin films, Femtosecond phenomena, Laser processing, Transition metals, Modulators, Terahertz radiation, Picosecond phenomena, Pulsed laser deposition, Thin film devices, Fast packet switching

PROCEEDINGS ARTICLE | April 6, 2016
Proc. SPIE. 9738, Laser 3D Manufacturing III
KEYWORDS: Electronics, Capacitors, Quartz, Metals, Copper, Copper vapor lasers, Laser applications, Laser development, 3D printing, Additive manufacturing, Printing, Bridges, Beam shaping, Laser manufacturing, Pulsed laser operation

SPIE Journal Paper | December 10, 2015
JBO Vol. 20 Issue 12
KEYWORDS: Printing, 3D printing, Reflectivity, Biomimetics, Tissues, Yeast, Rapid manufacturing, 3D image processing, Hyperspectral imaging, Chromophores

PROCEEDINGS ARTICLE | October 5, 2015
Proc. SPIE. 9544, Metamaterials, Metadevices, and Metasystems 2015
KEYWORDS: Metamaterials, Plasmonics, Video, Laser processing, Laser applications, Laser development, Current controlled current source

PROCEEDINGS ARTICLE | March 12, 2015
Proc. SPIE. 9351, Laser-based Micro- and Nanoprocessing IX
KEYWORDS: Microscopes, Optical lithography, Particles, Copper, Silver, Laser welding, Scanning electron microscopy, Printing, Photomicroscopy, Pulsed laser operation

Showing 5 of 27 publications
Conference Committee Involvement (2)
Laser Applications in Microelectronic and Optoelectronic Manufacturing XIII
21 January 2008 | San Jose, California, United States
Laser Applications in Microelectronics and Optoelectronic Manufacturing VIII
27 January 2003 | San Jose, CA, United States
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