Sean D. Huver
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 February 2009 Paper
Proceedings Volume 7225, 72250Q (2009) https://doi.org/10.1117/12.816029
KEYWORDS: Mirrors, Metrology, Scattering, Interferometers, Photons, Reflectivity, Interferometry, Mie scattering, Quantum physics, Spherical lenses

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