Dr. Sébastien Becker
R&D Engineer at CEA Grenoble
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 9 July 2018
Proc. SPIE. 10708, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy IX
KEYWORDS: Bolometers, Fabrication, Astronomy, Polarization, Sensors, Silicon, Resistance, Semiconducting wafers, Absorption

Proceedings Article | 24 June 2014
Proc. SPIE. 9070, Infrared Technology and Applications XL
KEYWORDS: Staring arrays, Bolometers, Packaging, Microbolometers, Thermography, Infrared sensors, Thin films, Electroluminescence, Infrared radiation, Semiconducting wafers

Proceedings Article | 24 October 2012
Proc. SPIE. 8541, Electro-Optical and Infrared Systems: Technology and Applications IX
KEYWORDS: Staring arrays, Bolometers, Packaging, Microbolometers, Infrared sensors, Thin films, Sensors, Resistance, Infrared radiation, Semiconducting wafers

Proceedings Article | 24 October 2012
Proc. SPIE. 8541, Electro-Optical and Infrared Systems: Technology and Applications IX
KEYWORDS: Staring arrays, Amorphous silicon, Readout integrated circuits, Infrared detectors, Microbolometers, Resistance, Reflectivity, Infrared radiation, Electro optics, Absorption

Proceedings Article | 31 May 2012
Proc. SPIE. 8353, Infrared Technology and Applications XXXVIII
KEYWORDS: Bolometers, Packaging, Microbolometers, Thermography, Infrared sensors, Infrared imaging, Resistance, Imaging devices, Measurement devices, Semiconducting wafers

Showing 5 of 9 publications
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