Sébastien Delcourt
at Univ des Lille
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Modeling, Data modeling, 3D modeling, Transistors, Field effect transistors, Semiconducting wafers, Thermal modeling, Cryogenics, Temperature metrology, Advanced distributed simulations

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