Prof. Seiji Hata
Senior Researcher at Kagawa Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (15)

SPIE Journal Paper | June 20, 2012
JEI Vol. 21 Issue 2
KEYWORDS: Machine vision, Analytical research, Image processing, Image analysis, Control systems, Mining, Computer engineering, Computing systems, Algorithm development, Mathematical modeling

PROCEEDINGS ARTICLE | May 17, 2012
Proc. SPIE. 8430, Optical Micro- and Nanometrology IV
KEYWORDS: Mirrors, Fringe analysis, Error analysis, LCDs, 3D metrology, Light sources and illumination, Phase measurement, 3D displays, Phase shifts, RGB color model

PROCEEDINGS ARTICLE | July 12, 2011
Proc. SPIE. 8000, Tenth International Conference on Quality Control by Artificial Vision
KEYWORDS: Mirrors, Light emitting diodes, Laser development, LCDs, 3D metrology, Light sources and illumination, Shape analysis, 3D displays, Phase shifts, RGB color model

PROCEEDINGS ARTICLE | October 8, 2007
Proc. SPIE. 6719, Optomechatronic Systems Control III
KEYWORDS: Cameras, Sensors, Image processing, Image sensors, Stereoscopic cameras, Projection systems, Robotic systems, Stereo vision systems, 3D vision, 3D image processing

PROCEEDINGS ARTICLE | May 29, 2007
Proc. SPIE. 6356, Eighth International Conference on Quality Control by Artificial Vision
KEYWORDS: Visual process modeling, Defect detection, Visualization, Image processing, Inspection, Imaging devices, Optical inspection, Printing, Color difference, Systems modeling

PROCEEDINGS ARTICLE | May 29, 2007
Proc. SPIE. 6356, Eighth International Conference on Quality Control by Artificial Vision
KEYWORDS: Sensors, Image processing, Robots, Projection systems, Robotic systems, Stereo vision systems, Robot vision, 3D vision, Astatine, 3D image processing

Showing 5 of 15 publications
Conference Committee Involvement (10)
10th International Conference on Quality Control by Artificial Vision
28 June 2011 | Saint-Etienne, France
Wavelet Applications in Industrial Processing VI
21 January 2009 | San Jose, California, United States
Wavelet Applications in Industrial Processing V
11 September 2007 | Boston, MA, United States
Optomechatronic Computer-Vision Systems
3 October 2006 | Boston, Massachusetts, United States
Wavelet Applications in Industrial Processing IV
2 October 2006 | Boston, Massachusetts, United States
Showing 5 of 10 published special sections
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