Seiji Morita
Chief Research Officer at Wisdom Pool Research Institute G.K
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 28 March 2017 Presentation + Paper
Seiji Morita, Ryuichi Saito, Ryosuke Yamamoto, Norikatsu Sasao, Tomoaki Sawabe, Koji Asakawa, Shinobu Sugimura
Proceedings Volume 10144, 101440R (2017) https://doi.org/10.1117/12.2257987
KEYWORDS: Lithography, Dry etching, Immersion lithography, Annealing, Resistance, Double patterning technology, Molecular self-assembly, Optical lithography, Scanning electron microscopy, Organic materials, Directed self assembly, Semiconducting wafers, Reactive ion etching, Metals

Proceedings Article | 4 April 2016 Paper
Seiji Morita, Masahiro Kanno, Ryousuke Yamamoto, Norikatsu Sasao, Shinobu Sugimura
Proceedings Volume 9777, 97770K (2016) https://doi.org/10.1117/12.2219141
KEYWORDS: Directed self assembly, Nanoimprint lithography, Optical lithography, Lithography, Quartz, Line edge roughness, Image processing, Photoresist processing, Line width roughness, Coating

SPIE Journal Paper | 7 August 2014 Open Access
Kenji Yoshimoto, Ken Fukawatase, Masahiro Ohshima, Yoshihiro Naka, Shimon Maeda, Satoshi Tanaka, Seiji Morita, Hisako Aoyama, Shoji Mimotogi
JM3, Vol. 13, Issue 03, 031305, (August 2014) https://doi.org/10.1117/12.10.1117/1.JMM.13.3.031305
KEYWORDS: Polymethylmethacrylate, Picosecond phenomena, Transmission electron microscopy, Calibration, Process modeling, Computer simulations, Optimization (mathematics), System on a chip, Image processing, Directed self assembly

Proceedings Article | 2 April 2014 Paper
Proceedings Volume 9050, 90501A (2014) https://doi.org/10.1117/12.2046326
KEYWORDS: Optical inspection, Inspection, Defect detection, Nanotechnology, Lithography, Semiconductors, Ultraviolet radiation, Semiconducting wafers, Organic materials, Optical resolution

Proceedings Article | 28 March 2014 Paper
Proceedings Volume 9049, 90491I (2014) https://doi.org/10.1117/12.2046307
KEYWORDS: Lithography, Organic materials, Line edge roughness, Ultraviolet radiation, Optical lithography, Electron beam lithography, Polymers, Scanning electron microscopy, Extreme ultraviolet lithography, Directed self assembly

Showing 5 of 10 publications
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