Ms. Selma Amara-Dababi Profile

Selma Amara-Dababi

at CEA

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 9 October 2012 Paper

Barrier breakdown mechanisms in MgO-based magnetic tunnel junctions under pulsed conditions and correlation with low-frequency noise

S. Amara-Dababi, H Bea, R. Sousa, C. Baraduc, K. MacKay, B. Dieny

Proceedings Volume 8461, 84610G (2012) https://doi.org/10.1117/12.930191

KEYWORDS: Magnetism, Resistance, Modulation, Reliability, Promethium, Oxides, Electrodes, Palladium, Data modeling, Magnesium

Read Abstract +

An investigation of barrier breakdown in MgO based Magnetic Tunnel Junctions submitted to pulsed electrical stress is presented. By studying the effect of delay between successive pulses, we observed that a very pronounced optimum in endurance of MTJs is obtained for an intermediate value of the delay between pulses corresponding to the characteristic time for a trapped electron in the barrier to escape from its trap. A charge trapping-detrapping model was proposed which consistently explains our experimental data. The delay between successive pulses affects the density of electrons trapped in the barrier. The average value in time and the time-modulation of the density of trapped charge give rise to distinct breakdown mechanisms. Our model allows evaluating the MTJ probability of breakdown for different applied pulse conditions. An expected endurance of the MTJs is then derived depending on the characteristics of the electrical stress in terms of delay, amplitude, unipolarity versus bipolarity. In a second part, low-frequency (0–12 kHz) noise measurements were performed in order to correlate the electrical noise with the defect density in the barrier.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years