Prof. Semion M. Sheraizin
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 April 2008 Paper
Proceedings Volume 6962, 69620A (2008) https://doi.org/10.1117/12.776260
KEYWORDS: X-rays, Image processing, Visualization, Object recognition, Resolution enhancement technologies, Automatic control, X-ray imaging, Spatial resolution, Signal to noise ratio, Denoising

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