Dr. Sen Wu
at Tianjin Univ
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11434, 2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
KEYWORDS: Optical microscopes, Mirrors, Silicon, Atomic force microscopy, Raman spectroscopy, Infrared spectroscopy, Head, Objectives, Molybdenum, Heterojunctions

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11434, 2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
KEYWORDS: Mirrors, Metrology, Imaging systems, Scanners, Atomic force microscopy, Laser scanners, 3D metrology, Aspheric lenses, 3D scanning, Laser beam diagnostics

Proceedings Article | 15 October 2015 Paper
Proc. SPIE. 9671, AOPC 2015: Advances in Laser Technology and Applications
KEYWORDS: Laser sources, Scattering, Skin, Laser applications, Laser scattering, Carbon dioxide lasers, Optical simulations, Acoustics, Pulsed laser operation, Absorption

Proceedings Article | 15 October 2015 Paper
Proc. SPIE. 9673, AOPC 2015: Micro/Nano Optical Manufacturing Technologies; and Laser Processing and Rapid Prototyping Techniques
KEYWORDS: Gold, Thin films, MATLAB, Calibration, Silicon, Atomic force microscopy, Silicon films, Reconstruction algorithms, 3D image processing, Actinium

Proceedings Article | 15 October 2015 Paper
Proc. SPIE. 9673, AOPC 2015: Micro/Nano Optical Manufacturing Technologies; and Laser Processing and Rapid Prototyping Techniques
KEYWORDS: Optical spheres, 3D image reconstruction, Calibration, Image processing, Image resolution, Atomic force microscopy, 3D metrology, Atomic force microscope, Reconstruction algorithms, 3D image processing

Showing 5 of 8 publications
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