Dr. Sen Zhou
at Chongqing Univ
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Sensors, Error analysis, Manufacturing, Laser applications, Inspection, Control systems, Clouds, Laser scanners, Distance measurement, Virtual reality

PROCEEDINGS ARTICLE | November 24, 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Metrology, Sensors, Calibration, Scanners, Manufacturing, Laser applications, Inspection, Laser scanners, 3D metrology, 3D scanning

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Optical filters, Reflection, Manufacturing, Inspection, Reflectivity, Clouds, Laser scanners, 3D metrology, 3D scanning, Laser optics

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