Dr. Seoho Lee
Senior Engineer at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 1, 2017
Proc. SPIE. 10217, Sensing for Agriculture and Food Quality and Safety IX
KEYWORDS: Near infrared, Safety, Statistical analysis, Visualization, Sensors, Spectroscopy, Spectrometers, Inspection, Physics, Nondestructive evaluation, Chemical analysis, Near infrared spectroscopy, Bacteria

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