Dr. Seonghyun Ko Profile

Dr. Seonghyun Ko

at POSTECH

SPIE Involvement:

Author

Publications (2)

Proceedings Article | 21 December 2007 Paper

Mechanical properties measurement of silicon nitride thin films using the bulge test

Hun Kee Lee, Seong Hyun Ko, Jun Soo Han, HyunChul Park

Proceedings Volume 6798, 67981C (2007) https://doi.org/10.1117/12.759587

KEYWORDS: Silicon, Silicon films, Thin films, Low pressure chemical vapor deposition, Reliability, Manufacturing, Microelectromechanical systems, Semiconducting wafers, Mathematical modeling, Spherical lenses

Read Abstract +

Proceedings Article | 11 April 2007 Paper

On the size-dependent behavior of the micro-wire in the micro-tensile test

Seonghyun Ko, Bongbu Jung, Hunkee Lee, Hyunchul Park

Proceedings Volume 6528, 65281M (2007) https://doi.org/10.1117/12.720751

KEYWORDS: Platinum, Microcrystalline materials, Microelectronics, Microsystems, Manufacturing, Corrosion, Mechanical engineering, Wafer testing, Semiconducting wafers, Chemical reactions

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years