Dr. Sergei Magonov
Senior Staff Scientist at Bruker AXS Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 November 2005 Paper
Proceedings Volume 6002, 60020S (2005) https://doi.org/10.1117/12.637486
KEYWORDS: Atomic force microscopy, Silicon, Visualization, Image resolution, Scanning probe microscopy, Silicon carbide, Crystals, Surface roughness, Microscopes, Image analysis

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