Dr. Sergei Magonov
Senior Staff Scientist at Bruker AXS Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 November 2005
Proc. SPIE. 6002, Nanofabrication: Technologies, Devices, and Applications II
KEYWORDS: Microscopes, Visualization, Crystals, Silicon, Surface roughness, Image resolution, Image analysis, Atomic force microscopy, Scanning probe microscopy, Silicon carbide

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