Dr. Sergey Pryshchep
at Rensselaer Polytechnic Institute
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 14 February 2020
JNP Vol. 14 Issue 01
KEYWORDS: Stimulated emission depletion microscopy, Image resolution, Point spread functions, Super resolution, Data modeling, Confocal microscopy, Deconvolution, Microscopes, Image enhancement, Microscopy

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