Dr. Sergey Rumyantsev
at Rensselaer Polytechnic Institute
SPIE Involvement:
Publications (10)

Proceedings Article | 7 October 2014 Paper
Proceedings Volume 9220, 92200N (2014) https://doi.org/10.1117/12.2062457
KEYWORDS: Capacitance, Sensors, Molybdenum, Resistance, Capacitors, Silicon, Semiconductors, Oxides, Metals, Doping

Proceedings Article | 22 June 2007 Paper
Proceedings Volume 6600, 66000I (2007) https://doi.org/10.1117/12.724282
KEYWORDS: Light emitting diodes, Quantum wells, External quantum efficiency, Resistance, Quantum efficiency, Photodiodes, Resistors, Green light emitting diodes, Superposition, Ultraviolet radiation

Proceedings Article | 22 June 2007 Paper
Sergey Rumyantsev, Alexander Dmitriev, Michael Levinshtein, Dmitri Veksler, Michael Shur, John Palmour, Mrinal Das, Brett Hull
Proceedings Volume 6600, 66001J (2007) https://doi.org/10.1117/12.723444
KEYWORDS: Diodes, Silicon carbide, Doping, Systems modeling, Diffusion, Transistors, Microwave radiation, Semiconductors, Data modeling, Resistors

Proceedings Article | 23 May 2005 Paper
S. Rumyantsev, S. Sawyer, N. Pala, M. Shur, Yu. Bilenko, J. P. Zhang, X. Hu, A. Lunev, J. Deng, R. Gaska
Proceedings Volume 5844, (2005) https://doi.org/10.1117/12.608559
KEYWORDS: Light emitting diodes, Resistance, Lamps, Halogens, Signal to noise ratio, Light sources, Photodetectors, Ultraviolet radiation, Photodiodes, Interference (communication)

Proceedings Article | 25 May 2004 Paper
Sergey Rumyantsev, Michael Shur, Wojciech Knap, Nina Dyakonova, Fabien Pascal, Alain Hoffman, Y. Ghuel, C. Gaquiere, D. Theron
Proceedings Volume 5470, (2004) https://doi.org/10.1117/12.546748
KEYWORDS: Magnetism, Resistance, Field effect transistors, Heterojunctions, Gallium nitride, Transistors, Aluminum nitride, Temperature metrology, Gallium arsenide, Metalorganic chemical vapor deposition

Showing 5 of 10 publications
Conference Committee Involvement (5)
Noise in Devices and Circuits III
24 May 2005 | Austin, Texas, United States
Fluctuations and Noise in Materials
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
Noise and Information in Nanoelectronics, Sensors, and Standards
2 June 2003 | Santa Fe, New Mexico, United States
Noise as a Tool for Studying Materials
2 June 2003 | Santa Fe, New Mexico, United States
Noise in Devices and Circuits
2 June 2003 | Santa Fe, New Mexico, United States
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