High resolution etching of MoSi for photomask processing places new requirements on etching processes. As resist features are sized to 100 nm and below, it is first necessary to duplicate these features first into a chrome over-layer. After resist is stripped, this chrome over-layer is used for etching MoSi. Both chrome and MoSi etched profiles require near-vertical sidewalls, good CD (critical dimension) uniformity, good linearity, and CD mean-to-target (MTT). Additional requirements of etched MoSi include minimal roughness on exposed quartz, selectivity to chrome and quartz, phase angle target and phase angle uniformity, etch depth global uniformity, and etch depth uniformity as a function of feature size. An ETEC integrated process is used for the application of resist, patterning, and all subsequent processing. Chemically amplified resist is patterned with the 50 kV MEBES Quadra or MEBES eXara raster scan electron beam writer, allowing for patterning of small features with vertical resist profiles. Plates are etched in a Tetra photomask etch system for projecting resist images into chrome and MoSi. Etch processes have been developed specifically for etching small features in order to meet the requirements of 65 nm node lithography. An optimized etch process window is capable of patterning MoSi features below 100 nm sizes with near-vertical sidewall, < 20 nm etch bias, and with similar profile and etch bias for lines and spaces between 100 nm and > 1 um. Excellent CD uniformity and CD etch loading performance are demonstrated. Micro-profilometry is employed to measure the MoSi etch depths of features of varying sizes, and to quantify the effect of loading on MoSi etch depth. SEM micrographs illustrate sidewall profiles resulting from small feature etching.
Photo mask etching for the 100nm technology node places new requirements on dry etching processes. As the minimum-size features on the mask, such as assist bars and optical proximity correction (OPC) patterns, shrink down to 100nm, it is necessary to produce etch CD biases of below 20nm in order to reproduce minimum resist features into chrome with good pattern fidelity. In addition, vertical profiles are necessary. In previous generations of photomask technology, footing and sidewall profile slope were tolerated, since this dry etch profile was an improvement from wet etching. However, as feature sizes shrink, it is extremely important to select etch processes which do not generate a foot, because this will affect etch linearity and also limit the smallest etched feature size. Chemically amplified resist (CAR) from TOK is patterned with a 50keV MEBES eXara e-beam writer, allowing for patterning of small features with vertical resist profiles. This resist is developed for raster scan 50 kV e-beam systems. It has high contrast, good coating characteristics, good dry etch selectivity, and high environmental stability. Chrome etch process development has been performed using Design of Experiments to optimize parameters such as sidewall profile, etch CD bias, etch CD linearity for varying sizes of line/space patterns, etch CD linearity for varying sizes of isolated lines and spaces, loading effects, and application to contact etching.
This paper represents development of techniques for classification of forest regions using radar images. SIR- C/L-SAR data were used. The application of textural features and artificial neural networks was considered.