Mr. Seung-Hyun Choi
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | April 13, 2012
Proc. SPIE. 8409, Third International Conference on Smart Materials and Nanotechnology in Engineering
KEYWORDS: Infrared detectors, Thermography, Defect detection, Cameras, Ultrasonography, Inspection, Nondestructive evaluation, Control systems, Finite element methods, Infrared radiation

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