Dr. Seung-Jean Kim
at Stanford Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 March 2006
Proc. SPIE. 6156, Design and Process Integration for Microelectronic Manufacturing IV
KEYWORDS: Statistical analysis, Computing systems, Monte Carlo methods, Capacitance, Optimization (mathematics), Digital electronics, Integrated circuit design, Stochastic processes, Statistical modeling, Instrument modeling

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