Prof. Seung-Woo Kim
Professor of Mechanical Engineering at KAIST
SPIE Involvement:
Author
Publications (69)

Proceedings Article | 3 September 2019
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Optical systems, Distance measurement, 3D metrology, Optical engineering, Laser metrology, Optical systems engineering, Positioning equipment

Proceedings Article | 3 September 2019
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Retroreflectors, 3D acquisition, Detection and tracking algorithms, Calibration, Distance measurement, 3D metrology, Optical tracking, Algorithm development, Signal detection, Pulsed laser operation

Proceedings Article | 13 June 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Femtosecond phenomena, Spectroscopy, Remote sensing, Gases, Fiber lasers, Semiconductor lasers, Laser spectroscopy, Spectral resolution, Femtosecond fiber lasers, Absorption

Proceedings Article | 16 March 2016
Proc. SPIE. 9754, Photonic Instrumentation Engineering III
KEYWORDS: Signal to noise ratio, Optical filters, Metrology, Fiber Bragg gratings, Interferometers, Frequency combs, Laser stabilization, Ultrafast lasers, Bragg cells, Laser optics

Proceedings Article | 15 March 2016
Proc. SPIE. 9739, Free-Space Laser Communication and Atmospheric Propagation XXVIII
KEYWORDS: Signal to noise ratio, Interference (communication), Frequency combs, Heterodyning, Free space optics, Bragg cells, Singular optics, Feedback control, Atmospheric optics, Channel projecting optics

Showing 5 of 69 publications
Conference Committee Involvement (12)
Interferometry XVII: Techniques and Analysis
17 August 2014 | San Diego, California, United States
Interferometry XVI: Techniques and Analysis
13 August 2012 | San Diego, California, United States
Interferometry XV: Techniques and Analysis
2 August 2010 | San Diego, California, United States
Optical Inspection and Metrology for Non-Optics Industries
3 August 2009 | San Diego, California, United States
Interferometry XIV: Techniques and Analysis
11 August 2008 | San Diego, California, United States
Showing 5 of 12 Conference Committees
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