Dr. Seyed Mohammad Naghibi Saber
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Refractive index, Polarization, Reflection, Imaging systems, Sensors, Wave plates, CCD cameras, Image sensors, Charge-coupled devices, CCD image sensors

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