Mr. Shahzad A. Qureshi
at Indian Institute of Technology Kanpur
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8549, 16th International Workshop on Physics of Semiconductor Devices
KEYWORDS: Thin films, Germanium, Resistance, Fourier transforms, Numerical simulations, Capacitance, Signal analysis, Analog electronics, Neodymium, Device simulation

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