Shanhu Shen
at Zhejiang Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 October 2008 Paper
Proceedings Volume 7122, 712241 (2008) https://doi.org/10.1117/12.801409
KEYWORDS: Photomasks, SRAF, Lithography, Optical proximity correction, Semiconducting wafers, Binary data, Resolution enhancement technologies, Mathematical modeling, Berkelium, Manufacturing

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