Mr. Sheng Liu Profile

Sheng Liu

Research Fellow at Oakland Univ

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Publications (5)

SPIE Journal Paper | 1 May 2007

Regional phase unwrapping method based on fringe estimation and phase map segmentation

Sheng Liu, Lian Xiang Yang

OE, Vol. 46, Issue 05, 051012, (May 2007) https://doi.org/10.1117/12.10.1117/1.2741232

KEYWORDS: Image segmentation, Edge detection, Optical engineering, Digital holography, Interferometry, Reflection, 3D metrology, Shearography, 3D vision, Phase measurement

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Proceedings Article | 14 August 2006 Paper

Phase unwrapping by a noise immune algorithm: fringe estimation, quality segmentation, and sorted extraction

Sheng Liu, Lian Yang

Proceedings Volume 6292, 62920C (2006) https://doi.org/10.1117/12.679260

KEYWORDS: Digital holography, Image segmentation, Edge detection, Shearography, 3D metrology, Interferometry, Optical testing, Software development, Holographic interferometry, Demodulation

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Proceedings Article | 19 August 2005 Paper

Vibration measurement of MEMS by digital laser microinterferometer

Sheng Liu, Dan Thomas, Praveen Samala, Lian Yang

Proceedings Volume 5878, 58780C (2005) https://doi.org/10.1117/12.617592

KEYWORDS: Microelectromechanical systems, Bragg cells, Mirrors, Vibrometry, Speckle, Fringe analysis, Control systems, CCD cameras, Diffraction, Reflectivity

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Proceedings Article | 18 August 2005 Paper

Strain measurement of a mouse bone by 3D-electronic speckle pattern interferometry (3D-ESPI)

Praveen Samala, Min Su, Sheng Liu, Hui Jiang, Hiroki Yokota, Lianxiang Yang

Proceedings Volume 5880, 58800C (2005) https://doi.org/10.1117/12.617670

KEYWORDS: Bone, Sensors, Speckle pattern, Interferometry, Beam splitters, CCD cameras, Spatial resolution, Tissues, Fringe analysis, Cameras

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Proceedings Article | 18 August 2005 Paper

Measurement of nugget size of spot weld by digital shearography

Lianxiang Yang, Praveen Samala, Sheng Liu, Kah Wah Long, Yung-Li Lee

Proceedings Volume 5880, 588008 (2005) https://doi.org/10.1117/12.617560

KEYWORDS: Shearography, Resistance, Nondestructive evaluation, Inspection, Metals, Fringe analysis, Mirrors, CCD cameras, Digital holography, Holography

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