Shengyang Huang
at National Univ of Defense Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 November 2007
Proc. SPIE. 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Spectrum analysis, Microlens array, Sensors, Wavefront sensors, Wave propagation, Turbulence, Charge-coupled devices, CCD image sensors, Atmospheric propagation, Correlation function

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