Prof. ShiFa Wu
at Dalian Univ of Technology
SPIE Involvement:
Author
Publications (14)

PROCEEDINGS ARTICLE | October 28, 2010
Proc. SPIE. 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
KEYWORDS: Optical fibers, Diffraction, Refractive index, Super resolution, Nano opto mechanical systems, Reflectivity, Image resolution, Near field scanning optical microscopy, Near field, Near field optics

PROCEEDINGS ARTICLE | May 19, 2006
Proc. SPIE. 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Proteins, Molecules, Silver, Light scattering, Surface enhanced Raman spectroscopy, Raman spectroscopy, Near field scanning optical microscopy, Near field, Raman scattering, Spectroscopes

PROCEEDINGS ARTICLE | February 9, 2005
Proc. SPIE. 5635, Nanophotonics, Nanostructure, and Nanometrology
KEYWORDS: Optical fibers, Reflection, Etching, Atomic force microscopy, Image transmission, Aluminum, Wet etching, Chemical elements, Scanning tunneling microscopy, Near field optics

PROCEEDINGS ARTICLE | February 9, 2005
Proc. SPIE. 5635, Nanophotonics, Nanostructure, and Nanometrology
KEYWORDS: Finite-difference time-domain method, Optical properties, Metals, Particles, Numerical simulations, Near field scanning optical microscopy, Near field, Wave propagation, Scanning tunneling microscopy, Photonic microstructures

PROCEEDINGS ARTICLE | February 9, 2005
Proc. SPIE. 5635, Nanophotonics, Nanostructure, and Nanometrology
KEYWORDS: Thin films, Finite-difference time-domain method, Metals, Microscopy, Silver, Surface enhanced Raman spectroscopy, Raman spectroscopy, Near field scanning optical microscopy, Near field, Raman scattering

PROCEEDINGS ARTICLE | February 9, 2005
Proc. SPIE. 5635, Nanophotonics, Nanostructure, and Nanometrology
KEYWORDS: Refractive index, Finite-difference time-domain method, Numerical simulations, Near field, Wave propagation, Signal detection, Statistical modeling, Scanning tunneling microscopy, Photonic microstructures, Near field optics

Showing 5 of 14 publications
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