Prof. Shin-Woong Park
Professor at Korea Univ Sejong Campus
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 26 March 2019
Proc. SPIE. 10959, Metrology, Inspection, and Process Control for Microlithography XXXIII
KEYWORDS: Point spread functions, Microscopy, Light scattering, Inspection, Image resolution, Scanning electron microscopy, Rayleigh scattering, Optical resolution, Mie scattering, Semiconducting wafers

Proceedings Article | 17 March 2007
Proc. SPIE. 6510, Medical Imaging 2007: Physics of Medical Imaging
KEYWORDS: X-ray computed tomography, Sensors, Scanners, X-rays, Computing systems, Detector arrays, Computed tomography, Reconstruction algorithms, X-ray imaging, X-ray detectors

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