Mr. Shinji Ishikawa
at Utsunomiya Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Signal to noise ratio, Confocal microscopy, Microscopes, Optical microscopes, Super resolution, Databases, Image sensors, Super resolution microscopy, Reconstruction algorithms, Lawrencium

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