Shinya Okazaki
at Hokkaido Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 17, 2008
Proc. SPIE. 7266, Optomechatronic Technologies 2008
KEYWORDS: Statistical analysis, Opto mechatronics, Imaging systems, Cameras, Error analysis, Stereoscopic cameras, Object recognition, Camera shutters, Current controlled current source

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