Dr. Shivakumar Raman
at Univ of Oklahoma
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 November 2005
Proc. SPIE. 5999, Intelligent Systems in Design and Manufacturing VI
KEYWORDS: Metrology, Manufacturing, Tolerancing, Inspection, Error analysis, Raman spectroscopy, Statistical analysis, Time metrology, Optimization (mathematics), Curium

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