Shuichiro Hayashi
at Keio Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 4 March 2019
Proc. SPIE. 10908, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XIX
KEYWORDS: Carbon, Electronics, Femtosecond phenomena, Metals, X-ray diffraction, Resistance, Scanning electron microscopy, Thermal effects, Silicon carbide

Proceedings Article | 4 March 2019
Proc. SPIE. 10905, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXIV
KEYWORDS: Fabrication, Light emitting diodes, Femtosecond phenomena, Sensors, Electrodes, Resistance, Scanning electron microscopy, Silicon carbide

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