Prof. Shuji Hasegawa
at Univ of Tokyo
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 January 2008
Proc. SPIE. 6800, Device and Process Technologies for Microelectronics, MEMS, Photonics, and Nanotechnology IV
KEYWORDS: Nanostructures, Electron beams, Electrodes, Metals, Indium, Resistance, Scanning electron microscopy, Scanning tunneling microscopy, Carbon nanotubes, Nanowires

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