Shujun Chen
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 3, 2009
Proc. SPIE. 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
KEYWORDS: Electrodes, Resistance, Image restoration, Computer simulations, Tomography, Inverse problems, Finite element methods, Reconstruction algorithms, Chemical elements, Algorithm development

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