Dr. Shunji Goto Profile

Dr. Shunji Goto

at Japan Synchrotron Radiation Research Institute

SPIE Involvement:

Conference Chair | Conference Program Committee | Author | Editor

Publications (38)

PROCEEDINGS ARTICLE | September 17, 2018

Optics design of a micro-focusing protein crystallography beamline using a wave calculation

Proc. SPIE. 10760, Advances in X-Ray/EUV Optics and Components XIII

KEYWORDS: Optical components, Diffraction, Mirrors, Optical design, Electron beams, Light sources, Proteins, X-rays, Far-field diffraction, Crystallography

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SPIE Conference Volume | November 15, 2017

Advances in X-Ray/EUV Optics and Components XII

SPIE Conference Volume | January 3, 2017

Advances in X-Ray/EUV Optics and Components XI

SPIE Conference Volume | September 29, 2015

Advances in X-Ray/EUV Optics and Components X

PROCEEDINGS ARTICLE | September 2, 2015

Effect of beamline optics vibration on the source size and divergence for synchrotron radiation

Proc. SPIE. 9588, Advances in X-Ray/EUV Optics and Components X

KEYWORDS: Mirrors, Light sources, X-ray optics, Crystals, X-rays, Synchrotron radiation, Astronomical imaging, Monochromators, Visual optics, Beam propagation method

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SPIE Conference Volume | October 8, 2014

Advances in X-Ray/EUV Optics and Components IX

PROCEEDINGS ARTICLE | September 5, 2014

Characterization of thin HPHT IIa diamond by transmission and reflection measurements

Proc. SPIE. 9207, Advances in X-Ray/EUV Optics and Components IX

KEYWORDS: Diffraction, Diamond, Reflection, Crystals, X-rays, Silicon, Reflectivity, Collimators, Transmittance, X-ray imaging

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SPIE Conference Volume | October 18, 2013

Advances in X-Ray/EUV Optics and Components VIII

PROCEEDINGS ARTICLE | September 27, 2013

Investigation of high thermal contact conductance at low contact pressure for high-heat-load optical elements of synchrotron radiation

Proc. SPIE. 8848, Advances in X-Ray/EUV Optics and Components VIII

KEYWORDS: Gold, Optical components, Sensors, Copper, Nickel, Interfaces, Indium, Synchrotron radiation, Plating, Temperature metrology

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SPIE Conference Volume | October 18, 2012

Advances in X-Ray/EUV Optics and Components VII

PROCEEDINGS ARTICLE | October 15, 2012

Diamond double-crystal monochromator at SPring-8

Proc. SPIE. 8502, Advances in X-Ray/EUV Optics and Components VII

KEYWORDS: Diamond, Image segmentation, Crystals, X-rays, Silicon, Near field diffraction, Laser crystals, Synchrotron radiation, Monochromators, Phase shifts

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PROCEEDINGS ARTICLE | October 15, 2012

Measurement of groove density variation of varied-line-space grating for high-resolution soft x-ray monochromator

Proc. SPIE. 8501, Advances in Metrology for X-Ray and EUV Optics IV

KEYWORDS: Diffraction, Monochromatic aberrations, Optical design, Statistical analysis, X-rays, Spectral resolution, Synchrotron radiation, Monochromators, Tolerancing, Diffraction gratings

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PROCEEDINGS ARTICLE | September 28, 2011

Characterization of beryllium foils for coherent x-ray applications of synchrotron radiation and XFEL beamlines

Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI

KEYWORDS: Polishing, Image processing, X-rays, X-ray lasers, Synchrotron radiation, Monochromators, X-ray imaging, Beryllium, Free electron lasers, X-ray characterization

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PROCEEDINGS ARTICLE | September 28, 2011

Thermal-contact-conductance measurement for high-heat-load optics components at SPring-8

Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI

KEYWORDS: Gold, Thermography, Crystals, Copper, Interfaces, Silicon, Optical testing, Synchrotron radiation, Cryogenics, Temperature metrology

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PROCEEDINGS ARTICLE | September 28, 2011

Progress on single crystal beryllium windows

Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI

KEYWORDS: Polishing, Coherence (optics), Sensors, Crystals, X-rays, Charge-coupled devices, Laser crystals, X-ray imaging, Beryllium, Near field optics

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PROCEEDINGS ARTICLE | September 28, 2011

Upgrade status of hard x-ray 100-nm probe beamlines BL37XU and BL39XU at SPring-8

Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI

KEYWORDS: Mirrors, Light sources, X-rays, Silicon, Magnetism, Monochromators, Laser beam diagnostics, Hard x-rays, Rhodium, Cryogenics

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PROCEEDINGS ARTICLE | September 23, 2011

Theory and numerical simulations of x-ray nanofocusing by bent crystal in back diffraction geometry

Proc. SPIE. 8141, Advances in Computational Methods for X-Ray Optics II

KEYWORDS: Diffraction, Monochromatic aberrations, X-ray optics, Crystals, X-rays, X-ray diffraction, Reflectivity, Numerical simulations, Wave propagation, Spherical lenses

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SPIE Conference Volume | September 8, 2011

Advances in X-Ray/EUV Optics and Components VI

PROCEEDINGS ARTICLE | September 2, 2010

Present status of upgraded long trace profiler for characterization of high-precision x-ray mirrors at SPring-8

Proc. SPIE. 7801, Advances in Metrology for X-Ray and EUV Optics III

KEYWORDS: Optical components, Mirrors, Beam splitters, Sensors, X-rays, Ceramics, Synchrotron radiation, Helium neon lasers, X-ray characterization, Temperature metrology

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SPIE Conference Volume | August 23, 2010

Advances in X-Ray/EUV Optics and Components V

PROCEEDINGS ARTICLE | September 9, 2009

Design optimization of highly accurate elliptical mirrors for hard-x-ray microfocusing probes at SPring-8

Proc. SPIE. 7448, Advances in X-Ray/EUV Optics and Components IV

KEYWORDS: Mirrors, X-ray optics, Spectroscopy, Error analysis, Photons, X-rays, Reflectivity, Magnetism, Rhodium, X-ray magnetic circular dichroism

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PROCEEDINGS ARTICLE | September 9, 2009

Development of a high-precision slit for x-ray beamline at SPring-8

Proc. SPIE. 7448, Advances in X-Ray/EUV Optics and Components IV

KEYWORDS: Microscopes, Mirrors, X-ray optics, Interferometers, X-rays, X-ray diffraction, Photography, Beam shaping, Monochromators, Standards development

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SPIE Conference Volume | August 24, 2009

Advances in X-Ray/EUV Optics and Components IV

PROCEEDINGS ARTICLE | September 3, 2008

Investigation of polycrystalline structure of CVD diamond using white-beam x-ray diffraction

Proc. SPIE. 7077, Advances in X-Ray/EUV Optics and Components III

KEYWORDS: Diffraction, X-ray optics, Diamond, Scattering, Sensors, Crystals, X-rays, X-ray diffraction, Chemical vapor deposition, Laser crystals

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PROCEEDINGS ARTICLE | September 3, 2008

Present status of stability improvement of SPring-8 standard x-ray monochromators

Proc. SPIE. 7077, Advances in X-Ray/EUV Optics and Components III

KEYWORDS: Diffraction, Diamond, Crystals, X-rays, Copper, Silicon, Laser crystals, Synchrotron radiation, Monochromators, Crystallography

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SPIE Conference Volume | August 28, 2008

Advances in X-Ray/EUV Optics and Components III

PROCEEDINGS ARTICLE | October 8, 2007

Directly water-cooled crystal development for SPring-8 bending magnet beamlines

Proc. SPIE. 6705, Advances in X-Ray/EUV Optics and Components II

KEYWORDS: Diffraction, Crystals, X-rays, Silicon, Photonic crystals, Distortion, Finite element methods, Laser crystals, Monochromators, Standards development

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PROCEEDINGS ARTICLE | October 1, 2007

Microstitching interferometer and relative angle determinable stitching interferometer for half-meter-long x-ray mirror

Proc. SPIE. 6704, Advances in Metrology for X-Ray and EUV Optics II

KEYWORDS: Actuators, Mirrors, Interferometers, X-rays, Photography, Multispectral imaging, Head, Synchrotron radiation, Neodymium, Fizeau interferometers

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PROCEEDINGS ARTICLE | September 27, 2007

Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-x-ray mirrors

Proc. SPIE. 6704, Advances in Metrology for X-Ray and EUV Optics II

KEYWORDS: Optical components, Mirrors, Metrology, Sensors, Error analysis, X-rays, Silicon, Interferometry, Silicon carbide, Spherical lenses

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PROCEEDINGS ARTICLE | September 20, 2007

Characterization of beryllium and CVD diamond for synchrotron radiation beamline windows and x-ray beam monitor

Proc. SPIE. 6705, Advances in X-Ray/EUV Optics and Components II

KEYWORDS: Diffraction, Diamond, Polishing, X-rays, Chemical vapor deposition, Image transmission, Synchrotron radiation, X-ray imaging, Beryllium, Surface finishing

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PROCEEDINGS ARTICLE | September 20, 2007

Measurement of thermal contact conductance of SPring-8 beamline components

Proc. SPIE. 6705, Advances in X-Ray/EUV Optics and Components II

KEYWORDS: Gold, Copper, Interfaces, Indium, Silicon, Silver, Resistance, Aluminum, Cryogenics, Temperature metrology

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SPIE Conference Volume | September 20, 2007

Advances in X-Ray/EUV Optics and Components II

PROCEEDINGS ARTICLE | May 18, 2007

Optics development for Japanese XFEL project

Proc. SPIE. 6586, Damage to VUV, EUV, and X-ray Optics

KEYWORDS: Optical components, Mirrors, X-ray optics, Diamond, X-rays, Silicon, Silicon carbide, Monochromators, Beryllium, Free electron lasers

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PROCEEDINGS ARTICLE | August 29, 2006

Evaluation of a modern soft x-ray monochromator with high resolving power over 10,000

Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications

KEYWORDS: Mirrors, Doppler effect, Calibration, Spectroscopy, X-rays, Xenon, Spectral resolution, Photoemission spectroscopy, Neon, Monochromators

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PROCEEDINGS ARTICLE | September 17, 2005

Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories

Proc. SPIE. 5921, Advances in Metrology for X-Ray and EUV Optics

KEYWORDS: Mirrors, Metrology, Sensors, Error analysis, X-rays, Silicon, Fourier transforms, Optical metrology, Synchrotron radiation, Data conversion

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PROCEEDINGS ARTICLE | January 5, 2001

1-km beamline at SPring-8

Proc. SPIE. 4145, Advances in X-Ray Optics

KEYWORDS: Diffraction, Diamond, Interferometers, Crystals, X-rays, Laser crystals, Synchrotron radiation, Monochromators, X-ray imaging, Beryllium

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PROCEEDINGS ARTICLE | November 16, 1999

SPring-8 standard x-ray monochromators

Proc. SPIE. 3773, X-Ray Optics Design, Performance, and Applications

KEYWORDS: Diffraction, Reflection, Crystals, X-rays, Copper, Silicon, Laser scattering, Distortion, Laser crystals, Monochromators

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PROCEEDINGS ARTICLE | December 11, 1998

Water-cooled first crystal as a solution for the high-heat-load problem at the SPring-8 undulator beamlines

Proc. SPIE. 3448, Crystal and Multilayer Optics

KEYWORDS: Diffraction, Crystals, X-rays, X-ray diffraction, Silicon, Liquid crystals, Laser crystals, Monochromators, X-ray imaging, Crystallography

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Showing 5 of 38 publications

Conference Committee Involvement (14)

Advances in X-Ray/EUV Optics and Components XIV

11 August 2019 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XIII

20 August 2018 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XII

8 August 2017 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XI

31 August 2016 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components X

11 August 2015 | San Diego, California, United States

Showing 5 of 14 published special sections

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