Dr. Shunsuke Yokozeki
Retired at
SPIE Involvement:
Author
Publications (25)

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Signal to noise ratio, Light sources, Fringe analysis, Digital holography, Speckle, Interferometry, Interference (communication), Speckle pattern, Speckle interferometry, Signal processing

PROCEEDINGS ARTICLE | September 11, 2012
Proc. SPIE. 8413, Speckle 2012: V International Conference on Speckle Metrology
KEYWORDS: Fringe analysis, Speckle, Cameras, Light scattering, Interferometry, Speckle pattern, Speckle interferometry, High speed cameras, Charge-coupled devices, Phase shifts

PROCEEDINGS ARTICLE | August 11, 2008
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Fringe analysis, Optical spheres, Speckle, Cameras, Metals, Fourier transforms, Speckle pattern, Speckle interferometry, High speed cameras, Camera shutters

PROCEEDINGS ARTICLE | September 15, 2006
Proc. SPIE. 6341, Speckle06: Speckles, From Grains to Flowers
KEYWORDS: Fringe analysis, Phase shifting, Speckle, Cameras, Photography, Interferometry, Speckle pattern, Speckle interferometry, Optical alignment, Phase shifts

PROCEEDINGS ARTICLE | August 14, 2006
Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis
KEYWORDS: Mirrors, Fringe analysis, Surface plasmons, Speckle, Amplifiers, Linear filtering, Speckle pattern, Speckle interferometry, Charge-coupled devices, Electronic filtering

PROCEEDINGS ARTICLE | March 7, 2006
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Moire patterns, Fringe analysis, Statistical analysis, Error analysis, Optical testing, Finite element methods, Shape analysis, Motion analysis, Stress analysis, Polonium

Showing 5 of 25 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top