Sifan Liu
at Univ of Tokyo
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Modulation, Laser scanners, Data processing, 3D metrology, Spatial resolution, 3D scanning, Ranging

Proceedings Article | 2 March 2020 Presentation + Paper
Proc. SPIE. 11287, Photonic Instrumentation Engineering VII
KEYWORDS: Continuous wave operation, Modulation, Ceramics, Inspection, Receivers, Laser scanners, 3D metrology, 3D scanning, Electro optics

Proceedings Article | 12 November 2019 Paper
Proc. SPIE. 11197, SPIE Future Sensing Technologies
KEYWORDS: Continuous wave operation, Manufacturing, Laser scanners, Collimation, 3D metrology, 3D scanning, Optical scanning systems, Laser optics, Optics manufacturing, Laser systems engineering

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