Dr. Simon G. Alcock
Senior Metrology Scientist at Diamond Light Source Ltd
SPIE Involvement:
Conference Program Committee | Author
Publications (14)

PROCEEDINGS ARTICLE | July 10, 2018
Proc. SPIE. 10706, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III
KEYWORDS: Mirrors, Single point diamond turning, Polishing, Error analysis, Surface roughness, 3D printing, Additive manufacturing, Space mirrors, Finite element methods, Aluminum, Lightweight mirrors

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9965, Adaptive X-Ray Optics IV
KEYWORDS: Mirrors, Light sources, Diamond, Polishing, Speckle, Electrodes, X-rays, Deformable mirrors, Deformable mirrors, Beam shaping, Surface finishing, Surface finishing

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9209, Advances in Computational Methods for X-Ray Optics III
KEYWORDS: Optical components, Mirrors, Electron beams, Light sources, X-rays, Wavefronts, Wave propagation, Optical simulations, Synchrotron radiation, Light wave propagation

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9208, Adaptive X-Ray Optics III
KEYWORDS: Mirrors, Light sources, Diamond, Polishing, Sensors, Electrodes, X-rays, Optical testing, Geometrical optics, Surface finishing

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9206, Advances in Metrology for X-Ray and EUV Optics V
KEYWORDS: Mirrors, Light sources, X-ray optics, Diamond, Metrology, Speckle, Sensors, X-rays, Wavefronts, Near field optics

PROCEEDINGS ARTICLE | September 28, 2011
Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI
KEYWORDS: Energy efficiency, Mirrors, Multilayers, Light sources, X-ray optics, Diamond, Crystals, X-rays, Reflectivity, Monochromators

Showing 5 of 14 publications
Conference Committee Involvement (5)
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Adaptive X-Ray Optics
3 August 2010 | San Diego, California, United States
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