Dr. Simon G. Alcock
Senior Metrology Scientist at Diamond Light Source Ltd
SPIE Involvement:
Author
Publications (20)

Proceedings Article | 16 September 2019 Presentation + Paper
Proc. SPIE. 11116, Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems II
KEYWORDS: Mirrors, Metals, Nickel, Manufacturing, 3D printing, Additive manufacturing, Space mirrors, Aluminum, Prototyping, Design for manufacturability

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Mirrors, Metrology, Scattering, Sensors, X-rays, Computer programming, Free electron lasers, Spectroscopes, Diffraction gratings

Proceedings Article | 9 September 2019 Presentation + Paper
Proc. SPIE. 11116, Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems II
KEYWORDS: Mirrors, Polishing, 3D printing, Additive manufacturing, Printing, Finite element methods, Lightweight mirrors, Surface finishing, Design for manufacturability

Proceedings Article | 9 September 2019 Presentation + Paper
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Mirrors, X-ray optics, Metrology, Sensors, Interferometry, Power supplies, Deformable mirrors

Proceedings Article | 9 September 2019 Presentation + Paper
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Mirrors, X-ray optics, Metrology, X-rays, Ions, Optical metrology, Ion beams, Synchrotrons, Optics manufacturing, Ion beam finishing

Showing 5 of 20 publications
Conference Committee Involvement (6)
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Showing 5 of 6 Conference Committees
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