Dr. Simon A. Haine
at Australian National Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 March 2019
Proc. SPIE. 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
KEYWORDS: Metrology, Optical spheres, Sensors, Chemical species, Particles, Interferometry, Computer programming, Quantum information, Phase shifts, Quantum computing

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