Dr. Simon Ruffell
at Australian National Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | February 17, 2010
Proc. SPIE. 7606, Silicon Photonics V
KEYWORDS: Silica, Spectroscopy, Annealing, Luminescence, Ions, Silicon, Sapphire, Erbium, Temperature metrology, Absorption

PROCEEDINGS ARTICLE | February 17, 2010
Proc. SPIE. 7606, Silicon Photonics V
KEYWORDS: Oxides, Silica, Annealing, Silicon, Diffusion, Transmission electron microscopy, Raman spectroscopy, Phonons, Nanocrystals, Temperature metrology

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