Prof. Simone Carmignato
at Univ degli Studi di Padova
SPIE Involvement:
Conference Program Committee | Author
Publications (5)

PROCEEDINGS ARTICLE | September 25, 2017
Proc. SPIE. 10391, Developments in X-Ray Tomography XI
KEYWORDS: Metrology, Optical spheres, X-ray computed tomography, Curium, Calibration, Error analysis, 3D metrology, Computed tomography, Standards development, Temperature metrology

PROCEEDINGS ARTICLE | July 23, 2010
Proc. SPIE. 7739, Modern Technologies in Space- and Ground-based Telescopes and Instrumentation
KEYWORDS: Reflectors, CMOS sensors, Astronomy, Metrology, Sensors, Calibration, Surface roughness, Interferometry, Antennas, Spatial resolution

PROCEEDINGS ARTICLE | January 19, 2009
Proc. SPIE. 7239, Three-Dimensional Imaging Metrology
KEYWORDS: Holography, Optical sensors, Optical spheres, Sensors, Calibration, Video, Error analysis, Optical testing, 3D metrology, 3D image processing

PROCEEDINGS ARTICLE | January 19, 2009
Proc. SPIE. 7239, Three-Dimensional Imaging Metrology
KEYWORDS: Optical sensors, Optical spheres, Sensors, Calibration, Interfaces, Optical testing, Laser scanners, Distance measurement, Optics manufacturing, Standards development

PROCEEDINGS ARTICLE | January 19, 2009
Proc. SPIE. 7239, Three-Dimensional Imaging Metrology
KEYWORDS: Metrology, Optical sensors, Optical properties, Sensors, Calibration, Polymers, Glasses, Video, Manufacturing, Standards development

Conference Committee Involvement (2)
3D Imaging Metrology
24 January 2011 | San Francisco Airport, California, United States
3D Imaging Metrology
19 January 2009 | San Jose, California, United States
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