Prof. Simone Carmignato Profile

Prof. Simone Carmignato

at Univ degli Studi di Padova

SPIE Involvement:

Conference Program Committee | Author

Publications (5)

PROCEEDINGS ARTICLE | September 25, 2017

Establishment of metrological traceability in porosity measurements by x-ray computed tomography

Proc. SPIE. 10391, Developments in X-Ray Tomography XI

KEYWORDS: Metrology, Optical spheres, X-ray computed tomography, Curium, Calibration, Error analysis, 3D metrology, Computed tomography, Standards development, Temperature metrology

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PROCEEDINGS ARTICLE | July 23, 2010

Surface measurements of radio antenna panels with white-light interferometry

Proc. SPIE. 7739, Modern Technologies in Space- and Ground-based Telescopes and Instrumentation

KEYWORDS: Reflectors, CMOS sensors, Astronomy, Metrology, Sensors, Calibration, Surface roughness, Interferometry, Antennas, Spatial resolution

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PROCEEDINGS ARTICLE | January 19, 2009

Estimating angle-dependent systematic error and measurement uncertainty for a conoscopic holography measurement system

Proc. SPIE. 7239, Three-Dimensional Imaging Metrology

KEYWORDS: Holography, Optical sensors, Optical spheres, Sensors, Calibration, Video, Error analysis, Optical testing, 3D metrology, 3D image processing

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PROCEEDINGS ARTICLE | January 19, 2009

Experimental study on performance verification tests for coordinate measuring systems with optical distance sensors

Proc. SPIE. 7239, Three-Dimensional Imaging Metrology

KEYWORDS: Optical sensors, Optical spheres, Sensors, Calibration, Interfaces, Optical testing, Laser scanners, Distance measurement, Optics manufacturing, Standards development

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