Prof. Simone Carmignato
at Univ degli Studi di Padova
SPIE Involvement:
Conference Program Committee | Author
Publications (5)

PROCEEDINGS ARTICLE | September 25, 2017
Proc. SPIE. 10391, Developments in X-Ray Tomography XI
KEYWORDS: Calibration, Standards development, Optical spheres, 3D metrology, Error analysis, Curium, Metrology, X-ray computed tomography, Computed tomography, Temperature metrology

PROCEEDINGS ARTICLE | July 23, 2010
Proc. SPIE. 7739, Modern Technologies in Space- and Ground-based Telescopes and Instrumentation
KEYWORDS: Interferometry, Antennas, Surface roughness, Spatial resolution, Metrology, Reflectors, Sensors, CMOS sensors, Calibration, Astronomy

PROCEEDINGS ARTICLE | January 19, 2009
Proc. SPIE. 7239, Three-Dimensional Imaging Metrology
KEYWORDS: Optical spheres, Error analysis, Holography, Sensors, 3D metrology, Optical sensors, Optical testing, 3D image processing, Video, Calibration

PROCEEDINGS ARTICLE | January 19, 2009
Proc. SPIE. 7239, Three-Dimensional Imaging Metrology
KEYWORDS: Sensors, Optical spheres, Optical sensors, Standards development, Optical testing, Laser scanners, Calibration, Optics manufacturing, Distance measurement, Interfaces

PROCEEDINGS ARTICLE | January 19, 2009
Proc. SPIE. 7239, Three-Dimensional Imaging Metrology
KEYWORDS: Calibration, Optical sensors, Glasses, Sensors, Metrology, Standards development, Manufacturing, Video, Polymers, Optical properties

Conference Committee Involvement (2)
3D Imaging Metrology
24 January 2011 | San Francisco Airport, California, United States
3D Imaging Metrology
19 January 2009 | San Jose, California, United States
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